Uniaxial stress effects on valence band structures of GaN

Materials Research Society Symposium - Proceedings

Volumn 482, Issue , 1997, Pages 893-898

  Yamaguchi, A A ^a   Mochizuki, Y ^a   Sasaoka, C ^a   Kimura, A ^a   Nido, M ^a   Usui, A ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; DEFORMATION; FUNCTIONS; NITRIDES; POLARIZATION; SEMICONDUCTING GALLIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; STRESS ANALYSIS;

GALLIUM NITRIDE; REFLECTANCE SPECTROSCOPY; UNIAXIAL STRESS EFFECTS; WAVEFUNCTIONS;

SEMICONDUCTING FILMS;

EID: 0031348872     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-482-893     Document Type: Conference Paper

References (17)