Characterization of bulk, polycrystalline indium nitride grown at sub-atmospheric pressures

Materials Research Society Symposium - Proceedings

Volumn 482, Issue , 1997, Pages 549-554

  Dyck, Jeffrey S ^a   Kash, Kathleen ^a   Kim, Kwiseon ^a   Lambrecht, Walter R L ^a   Hayman, Cliff C ^a   Argoitia, Alberto ^a   Grossner, Michael T ^a   Zhou, Weilie L ^a   Angus, John C ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PRESSURE; CRYSTALLIZATION; ELECTRON DIFFRACTION; LATTICE CONSTANTS; MOLTEN MATERIALS; PLASMA SOURCES; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; SYNTHESIS (CHEMICAL); X RAY CRYSTALLOGRAPHY;

FULL POTENTIAL LINEAR MUFFIN TIN ORBITAL (FPLMTO) METHOD; INDIUM NITRIDE;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0031348865     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)