Microscopic analysis of carrier removal in heavily irradiated silicon solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1997, Pages 835-838

  Taylor, S J ^a   Yamaguchi, M ^a   Imaizumi, M ^a   Yang, M J ^a   Ito, T ^a   Yamaguchi, T ^a   Watanabe, S ^a   Ando, K ^a   Matsuda, S ^a   Hisamatsu, T ^a  

^a TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARGE CARRIERS; ELECTRONS; ION BOMBARDMENT; MICROSCOPIC EXAMINATION; PROTONS; RADIATION EFFECTS; SEMICONDUCTING SILICON;

CARRIER REMOVAL;

SILICON SOLAR CELLS;

EID: 0031348785     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)