Automated segmentation and feature extraction of product inspection items

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3073, Issue , 1997, Pages 96-107

  Talukder, Ashit ^a   Casasent, David P ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER VISION; FEATURE EXTRACTION; PATTERN RECOGNITION; REAL TIME SYSTEMS; X RAY FILMS;

LINESCAN; NUTMEAT IMAGES; OPTICAL PATTERN RECOGNITION; PISTACHIO NUTS;

INSPECTION;

EID: 0031348650     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)