Experimental comparison of load-pull measurement systems for nonlinear power transistor characterization

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 6, 1997, Pages 1251-1255

  Deshours, Frédérique ^a   Bergeault, Eric ^a   Blache, F ^b   Villotte, Jean Pierre ^b   Villeforceix, B ^c  

^a TELECOM PARISTECH   (France)

^b Institut de Recherche en Communications Optiques et Microondes (IRCOM)   (France)

^c ORANGE LABS   (France)

Author keywords

Heterodyne network analyzer; Large signal experimental characterization; Load pull techniques; Nonlinear; Power added efficiency; Power transistors; Six port reflectometers; Tuner

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYZERS; MESFET DEVICES; NONLINEAR NETWORK ANALYSIS;

LOAD PULL MEASUREMENT;

ELECTRIC POWER MEASUREMENT;

EID: 0031347998     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.668266     Document Type: Article

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