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Volumn 20, Issue 1, 1997, Pages 19-39

Electrostatic repulsion between highly injecting metals: An experimental investigation

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC CONTACTS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRODES; ELECTROSTATICS; INTERFACES (MATERIALS);

EID: 0031347976     PISSN: 08827516     EISSN: None     Source Type: Journal    
DOI: 10.1155/1997/19198     Document Type: Article
Times cited : (1)

References (20)
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    • Electronic processes in dielectric liquids under incipient breakdown stress
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    • The reliability of the asperity contact model in determining charge injection across interfaces
    • Chicago
    • C.T Dervos, "The reliability of the asperity contact model in determining charge injection across interfaces", Proc. 40th IEEE Holm Conf. on Electrical Contacts, Vol 40, pp. 211-222, Chicago, (1994).
    • (1994) Proc. 40th IEEE Holm Conf. on Electrical Contacts , vol.40 , pp. 211-222
    • Dervos, C.T.1
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    • 84877755022 scopus 로고
    • Theoretical and experimental investigations of the dynamic molten bridge
    • T. Utsumi. "Theoretical and experimental investigations of the dynamic molten bridge". IEEE Trans Parts. Hybrids. Packag., VoL 5, pp. 62-68, (1969).
    • (1969) IEEE Trans Parts. Hybrids. Packag. , vol.5 , pp. 62-68
    • Utsumi, T.1
  • 11
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    • Exhibiting chaos and fragments with a microcomputer
    • D.C Arney, B.T. Robinson, "Exhibiting chaos and fragments with a microcomputer", Comput. Math. Appl., Vol. 19, No. 3, pp. 1-11, (1990).
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    • Arney, D.C.1    Robinson, B.T.2
  • 12
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    • Bifurcation evolution across metal-metal contacts sustaining high charge injection rates
    • C.T. Dervos and P.T. Fitsilis. "Bifurcation evolution across metal-metal contacts sustaining high charge injection rates". IEEE Trans Comp. Packag. Manuf. Technol., Vol. 17, No 2, pp. 286-294, (1994).
    • (1994) IEEE Trans Comp. Packag. Manuf. Technol. , vol.17 , Issue.2 , pp. 286-294
    • Dervos, C.T.1    Fitsilis, P.T.2
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    • 0028749723 scopus 로고
    • A sensitive device for the measurement of the force exerted by the arc on the electrodes
    • Chicago. USA. Oct. 17-19
    • J.P. Chabrerie, J. Devautour, A.M. Gouega and Ph. Teste', "A sensitive device for the measurement of the force exerted by the arc on the electrodes". Proc of 40th Holm Conference on Electrical Contacts, Vol. 40, pp. 261-267, Chicago. USA. Oct. 17-19. (1994).
    • (1994) Proc of 40th Holm Conference on Electrical Contacts , vol.40 , pp. 261-267
    • Chabrerie, J.P.1    Devautour, J.2    Gouega, A.M.3    Teste', Ph.4
  • 18
    • 9144258943 scopus 로고
    • Generalised formula for the electric tunnel effect between similar electrodes separated by a thin insulating film
    • J.C. Simmons. "Generalised formula for the electric tunnel effect between similar electrodes separated by a thin insulating film". J. Appl. Phys., Vol 34, No 6, pp. 1793-1803, (1963).
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    • Simmons, J.C.1
  • 19
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    • Field emission in liquids
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    • Halpern, B.1    Gomer, R.2
  • 20
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    • Field ionisation in liquids
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    • Halpern, B.1    Gomer, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.