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Volumn 21, Issue 4, 1997, Pages 469-473

Point defect compensation phenomena in CdTe

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DIFFUSION IN SOLIDS; ELECTRIC VARIABLES MEASUREMENT; HIGH TEMPERATURE PROPERTIES; POINT DEFECTS; SEMICONDUCTING INDIUM; SEMICONDUCTOR DOPING; SOLUBILITY;

EID: 0031347829     PISSN: 03645916     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0364-5916(98)00004-2     Document Type: Article
Times cited : (3)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.