Structural investigation of Pt-Al2O3 co-sputtered nano-cermet films studied by small angle X-ray scattering, grazing angle X-ray reflectometry, TEM and AFM

Surface and Coatings Technology

Volumn 97, Issue 1-3, 1997, Pages 603-610

  Sella, C ^a   Maaza M ^b,c   Pardo, B ^c   Dunsteter, F ^d   Martin, J C ^e   Sainte Catherine, M C ^f   Kaba, A ^g  

^a CNRS   (France)

^b UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^c INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

^d LABORATOIRE DES SOLIDES IRRADIÉS   (France)

^e UNIV PARIS SUD   (France)

^f CREA ETCA DGA   (France)

^g UNIVERSITÉ CHEIKH ANTA DIOP   (Senegal)

Author keywords

Atomic force microscopy; Cermet films; Cosputtering; Grazing angle X ray reflectometry; Small angle X ray scattering; Transmission electron microscopy

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CERMETS; FILM GROWTH; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PLATINUM COMPOUNDS; REFLECTOMETERS; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

GRAZING ANGLE X RAY REFLECTOMETRY; SMALL ANGLE X RAY SCATTERING;

CERAMIC COATINGS;

EID: 0031347610     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00321-6     Document Type: Article

References (4)

1. C. Sella, A. Bichri, J.C. Martin, J. Lafait, K. Driss-Khodja, S. Berthier, Physica A 157 (1989) 555-560.
2. J.L. Dormann, D. Fiorani, J.L. Tholence, C. Sella, J. Magn. Magn. Mater. 35 (1983) 117-120.
3. F. Bridou, B. Pardo, J. Optics (Paris) 21 (4) (1990) 183-191.
4. M. Maaza, A. Gibaud, C. Sella, B. Pardo, F. Dunsteter, J. Corno, F. Bridou, A. Menelle, G. Vignaud, A. Désert, Phys. Lett. A, in press.