Implementation of a test wafer inventory tracking system to increase efficiency in monitor wafer usage

IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop

Volumn , Issue , 1997, Pages 440-443

  Popovich, Sandy B ^a   Chilton, Shane R ^a   Kilgore, Bruce ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; COST EFFECTIVENESS; ELECTRONIC CIRCUIT TRACKING; MANAGEMENT; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SYSTEMS ENGINEERING;

COST CONTAINMENT; REUSE OPPORTUNITIES; TEST WAFER INVENTORY TRACKING SYSTEM;

INVENTORY CONTROL;

EID: 0031346315     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)