Accurate evaluation of circularity using selective data partition

Industrial Engineering Research - Conference Proceedings

Volumn , Issue , 1997, Pages 251-256

  Anand, Sam ^a   Rajagopal, Karthik ^a  

^a UNIVERSITY OF CINCINNATI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; DATA ACQUISITION; ERROR DETECTION; ITERATIVE METHODS; LEAST SQUARES APPROXIMATIONS; QUALITY CONTROL; SPATIAL VARIABLES MEASUREMENT; STANDARDS;

COMPUTATIONAL METROLOGY; COORDINATE MEASURING MACHINE (CMM); SELECTIVE DATA PARTITION (SDP); VORONOI DIAGRAM METHOD;

FITS AND TOLERANCES;

EID: 0031345643     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)