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Volumn 1, Issue , 1997, Pages 317-322
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High temperature testing of a buck converter using silicon and silicon carbide diodes
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
MOSFET DEVICES;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTOR DIODES;
SILICON CARBIDE;
THERMAL EFFECTS;
BUCK CONVERTERS;
SILICON CARBIDE DIODES;
ELECTRIC CONVERTERS;
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EID: 0031345350
PISSN: 0146955X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (9)
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