System level boundary scan in a highly integrated switch

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 636-639

  Hughes III, William J ^a  

^a General Signal Networks   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTICHIP MODULES; PRINTED CIRCUIT BOARDS; SWITCHING SYSTEMS;

SYSTEM LEVEL BOUNDARY SCAN;

INTEGRATED CIRCUIT TESTING;

EID: 0031344749     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)