Improving cycle time through managing variability in a DRAM production line

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 1997, Pages

  Maiorana, Angelo ^a   Iuliano, Guglielmo ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROCESS CONTROL; PRODUCTION CONTROL; PRODUCTIVITY; RANDOM ACCESS STORAGE;

CYCLE TIMES; DYNAMIC RANDOM ACCESS MEMORY (DRAM);

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0031344518     PISSN: 10788743     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)