Manufacturing pattern development for the Alpha 21164 microprocessor

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 278-285

  Stolicny, Carol ^a   Davies, Richard ^a   McKernan, Pamela ^a   Truong, Tuyen ^a  

^a Digital Semiconductor   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; HEURISTIC METHODS; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS;

DESIGN FOR TESTABILITY (DFT) METHOD; DESIGN VERIFICATION TEST (DVT);

INTEGRATED CIRCUIT TESTING;

EID: 0031344111     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)