Hydrogen effects on GaAs microwave semiconductors

GaAs Reliability Workshop, Proceedings

Volumn , Issue , 1997, Pages 66-71

  Ragle, Dwayne ^a   Kayali, Sammy ^a  

^a Shason Microwave Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTS; FAILURE ANALYSIS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; RELIABILITY;

HYDROGEN EFFECTS; MICROWAVE SEMICONDUCTORS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0031343854     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)