Fail-stop controller AE11

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 567-577

  Boehl, E ^a   Lindenkreuz, Th ^a   Stephan, R ^a  

^a ROBERT BOSCH GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; STANDARDS;

FAIL STOP CONTROLLERS;

INTEGRATED CIRCUIT TESTING;

EID: 0031343653     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (57)