Resistance behavior of Cr-Si-O thin films

TMS Annual Meeting

Volumn , Issue , 1997, Pages 211-219

  Jankowski, A F ^a   Hayes, J P ^a   Musket, R ^a   Cosandey, F ^a   Gorla, C E ^a   Besser, R S ^a   Westerlind, V ^a   Cobai, G ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CHROMIUM COMPOUNDS; ELECTRIC CONDUCTIVITY OF SOLIDS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON COMPOUNDS; SPUTTER DEPOSITION;

METASTABILITY; THERMAL AGING; THIN COATINGS;

COATINGS;

EID: 0031343293     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)