Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 597-606

  Konuk, Haluk ^a   Ferguson, F Joel ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CIRCUIT OSCILLATIONS; CMOS INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC WIRING; INTEGRATED CIRCUIT MANUFACTURE;

INTERCONNECT OPENS;

INTEGRATED CIRCUIT TESTING;

EID: 0031342932     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)