Fault-tolerant embedded microcontroller testbed

Proceedings of the Pacific Rim International Symposium on Fault Tolerant Systems, PRFTS

Volumn , Issue , 1997, Pages 7-14

  Rennels, D A ^a   Caldwell, D W ^a   Hwang, R ^a   Mesarina, M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER TESTING; DESIGN; MICROELECTROMECHANICAL DEVICES; REDUNDANCY; TEST FACILITIES;

FAULT DETECTION;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0031342896     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)