Effect of strong illumination on current-voltage characteristics of Au/Si, Ai/Si and Sn/Si Schottky barriers with native oxide layer

Journal of Materials Science: Materials in Electronics

Volumn 8, Issue 6, 1997, Pages 409-418

  Hamdi, W I ^a  

^a Ain Shams University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; INTERFACES (MATERIALS); LEAKAGE CURRENTS; LIGHTING; SEMICONDUCTOR JUNCTIONS;

BARRIER HEIGHT; DARK CURRENT; OXIDE LAYER; PHOTOCURRENT; PHOTOGENERATED CURRENT;

SCHOTTKY BARRIER DIODES;

EID: 0031342815     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018560027832     Document Type: Article

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