Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's

Proceedings of the International Conference on Microelectronics

Volumn 2, Issue , 1997, Pages 659-662

  Goh, Y H ^a   Ah, L K ^a   Ling, C H ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; HOT CARRIERS;

CHARGE PUMPING CURRENT; GATED DIODE DRAIN CURRENT;

MOSFET DEVICES;

EID: 0031342310     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)