Advances in stress test chips

American Society of Mechanical Engineers, EEP

Volumn 22, Issue , 1997, Pages 1-5

  Jaeger, Richard C ^a   Suhling, Jeffrey C ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; RESISTORS; SEMICONDUCTING SILICON; SENSITIVITY ANALYSIS; SILICON SENSORS; STRESS ANALYSIS;

SILICON PIEZORESISTIVE STRESS SENSOR TEST CHIPS;

ELECTRONICS PACKAGING;

EID: 0031340015     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (31)