Simple models for film growth by energetic cluster impact

Radiation Effects and Defects in Solids

Volumn 142, Issue 1-4, 1997, Pages 39-50

  Moseler, Michael ^a   Nordiek, Johannes ^a   Rattunde, Oliver ^a   Haberland, Hellmut ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Atomic force microscope; Cluster surface collisions; Growth; Surface roughening; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MOLECULAR DYNAMICS; PLASTIC FLOW; RADIATION DAMAGE; SURFACE ROUGHNESS; THIN FILMS;

CLUSTER DEPOSITED FILMS;

FILM GROWTH;

EID: 0031339974     PISSN: 10420150     EISSN: None     Source Type: Journal    
DOI: 10.1080/10420159708211595     Document Type: Article

References (10)

1. H. Haberland, M. Mall, M. Moseler, Y. Qiang, T. Reiners and Y. Thurner, J. Vac. Sci. and Technol. A 12, 2925 (1994).
2. O. Rattunde, Diploma thesis, University of Freiburg, Physics Department (1995). (unpublished).
3. H. Haberland, Z. Insepov and M. Moseler, Phys. Rev. B 51, 11061 (1995).
4. J. Nordiek, M. Moseler and H. Haberland, within this volume.
5. M. Kardar, G. Parisi and Y. Zhang, Phys. Rev. Lett. 56, 889 (1986).
6. S.F. Edwards and D.R. Wilkinson, Proc. Roy. Soc. Lond. A 381, 17 (1982).
7. M. Villarica, M.J. Casey, J. Goodisman and J. Chaiken, J. Chem. Phys. 98, 4610 (1993).
8. M.J. Vold, J. Chem. Phys. 63, 1608 (1959).
9. F. Family and T. Vicsek, J. Phys. A: Math. Gen. 18, L75 (1985).
10. P. Meakin, J. Phys. A: Math. Gen. 20, L1113 (1987).