X-ray photoelectron spectroscopic study of B-N-Ti system

Materials Research Society Symposium - Proceedings

Volumn 472, Issue , 1997, Pages 269-274

  Seal, Sudipta ^a   Barr, Tery L ^a   Sobczak, Natalie ^a   Benko, Ewa ^a   Morgiel, J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; DIFFUSION IN SOLIDS; ETCHING; FILM GROWTH; INTERFACES (MATERIALS); MORPHOLOGY; TERNARY SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

NITRIDATION; OXYNITRIDE; SPUTTER ETCHING;

NITRIDES;

EID: 0031339821     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (32)