Texture analysis of LiF thin films evaporated onto amorphous substrates at different temperatures

Physica Status Solidi (A) Applied Research

Volumn 164, Issue 2, 1997, Pages 747-756

  Di Nunzio, P E ^a,b   Fornarini, L ^a   Martelli, S ^a   Montereali, R M ^a  

^a ENEA   (Italy)

^b CENTRO SVILUPPO MATERIALI S P A   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL ORIENTATION; EVAPORATION; HIGH TEMPERATURE PROPERTIES; LITHIUM COMPOUNDS; LOW TEMPERATURE OPERATIONS; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SUBSTRATES; TEXTURES;

LOW/HIGH TEMPERATURE EVAPORATIONS;

THIN FILMS;

EID: 0031339374     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396x(199712)164:2<747::aid-pssa747>3.0.co;2-3     Document Type: Article

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