High field breakdown characteristics of micrometric gaps in vacuum

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn , Issue , 1997, Pages 725-729

  Ma, Xianyun ^a   Kim, J D ^a   Sudarshan, T S ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISPLAY DEVICES; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRODES; VACUUM TECHNOLOGY;

FIELD EMISSION DISPLAY (FED); MICROMETRIC GAPS;

FIELD EMISSION CATHODES;

EID: 0031339367     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)