Possibilities and limitations of IDDQ testing in submicron CMOS

Proceedings of the Annual IEEE International Conference on Innovative Systems in Silicon

Volumn , Issue , 1997, Pages 174-185

  Figueras, Joan ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; INTEGRATED CIRCUIT TESTING; PROBABILITY DENSITY FUNCTION;

DEEP SUBMICRON TECHNOLOGIES;

CMOS INTEGRATED CIRCUITS;

EID: 0031339078     PISSN: 10632204     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)