New probe card technology using compliant MicrospringsTM

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 527-532

  Sporck, Nicholas ^a  

^a FORMFACTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROBE CARD TECHNOLOGY;

ELECTRONICS INDUSTRY; MICROPROCESSOR CHIPS;

INTEGRATED CIRCUIT TESTING;

EID: 0031338825     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1997.639659     Document Type: Conference Paper

References (0)