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Volumn 44, Issue 6 pt 1, 1997, Pages 1789-2385
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Proceedings of the 1997 IEEE Nuclear and Space Radiation Effects Conference, NSREC. Part 1 (of 3)
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR INTEGRATED CIRCUITS;
BIPOLAR TRANSISTORS;
CMOS INTEGRATED CIRCUITS;
DOSIMETRY;
MOSFET DEVICES;
OPTOELECTRONIC DEVICES;
PARTICLE SPECTROMETERS;
RADIATION HARDENING;
RADIATION SHIELDING;
SEMICONDUCTOR LASERS;
SILICA;
SUPERCONDUCTING WIRE;
BIPOLAR JUNCTION TRANSISTORS (BJT);
EIREV;
GAMMA IRRADIATION;
LATENT INTERFACE TRAP BUILDUP;
OPTOCOUPLERS;
PROTON IRRADIATION;
RADIATION INDUCED CHARGE TRAPPING;
SINGLE EVENT LATCHUP;
SINGLE EVENT UPSETS;
VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);
RADIATION EFFECTS;
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EID: 0031338712
PISSN: 00189499
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (5)
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References (0)
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