Reconstructed (881) Si surface structure observed by scanning tunneling microscopy

Journal of Applied Physics

Volumn 82, Issue 12, 1997, Pages 6031-6036

  Kawamura, Tsutomu ^a   Kojima, Shiro ^a   Kanzawa, Tomohide ^a  

^a KOKUSHIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; FOURIER TRANSFORMS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; SURFACE TREATMENT; THERMODYNAMIC STABILITY;

DANGLING BOND DENSITY; PERIODIC BOND CHAIN VECTOR APPROXIMATION; ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPY;

SEMICONDUCTING SILICON;

EID: 0031338112     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366548     Document Type: Article

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