Residual stresses in ultrathin metal sublayers within Au/Ni multilayers

Materials Research Society Symposium - Proceedings

Volumn 475, Issue , 1997, Pages 363-368

  Labat, S ^a   Gergaud, P ^a   Thomas, O ^a   Gilles, B ^a   Marty, A ^a   Lefebvre, S ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); GOLD; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; NICKEL; RESIDUAL STRESSES; STRAIN; ULTRATHIN FILMS; X RAY DIFFRACTION ANALYSIS;

ATOMIC RATIO; METALLIC MULTILAYERS; ULTRATHIN METALS;

MULTILAYERS;

EID: 0031337772     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-475-363     Document Type: Conference Paper

References (17)