Protection of high voltage power and programming pins

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1997, Pages 246-254

  Maloney, Timothy J ^a   Parat, Krishna ^a   Clark, Neal K ^a   Darwish, Ali ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC BREAKDOWN OF SOLIDS; ELECTROSTATICS;

CANTILEVER CLAMPS; HIGH VOLTAGE POWER PINS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0031337676     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eosesd.1997.634249     Document Type: Conference Paper

References (4)