Hydrogen transport through nickel hydroxide film: Current transient analysis

Electrochimica Acta

Volumn 42, Issue 16, 1997, Pages 2465-2474

  Yoon, Young Gi ^a   Pyun, Su Il ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Current transient; Hydrogen diffusion coefficient; Hydrogen transport; Nickel hydroxide; Phase boundary movement

Indexed keywords

BOUNDARY CONDITIONS; COBALT COMPOUNDS; COMPOSITION EFFECTS; COMPUTER SIMULATION; DIFFUSION IN SOLIDS; ELECTRIC CURRENTS; ELECTRODEPOSITION; HYDROGEN; NICKEL COMPOUNDS; TRANSIENTS;

CURRENT TRANSIENTS; HYDROGEN TRAPPING; MCNABB FOSTER'S PHYSICAL MODELS; NICKEL HYDROXIDE; PHASE BOUNDARY MOVEMENT;

METALLIC FILMS;

EID: 0031337606     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(96)0043S-S     Document Type: Article

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