On-line CMOS BICS: an experimental study

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 85-89

  Maidon, Y ^a   Deval, Y ^a   Tomas, J ^a   Verdier, F ^a   Begueret, J B ^a   Dom, J P ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POWER SUPPLIES TO APPARATUS; MEASUREMENTS; ONLINE SYSTEMS; SENSORS;

IDDQ TEST;

CMOS INTEGRATED CIRCUITS;

EID: 0031337518     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)