Imprint induced failure modes in ferroelectric non-volatile memories

Integrated Ferroelectrics

Volumn 15, Issue 1-4, 1997, Pages 29-38

  Benedetto, J M ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CAPACITORS; DIELECTRIC FILMS; FAILURE ANALYSIS; NONVOLATILE STORAGE; RANDOM ACCESS STORAGE;

EXTERNAL BIAS INDUCED IMPRINT; IMPRINT INDUCED FAILURE MODES; PREFERENTIAL AGING INDUCED IMPRINT;

FERROELECTRIC DEVICES;

EID: 0031334933     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708015694     Document Type: Article

References (11)

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