Combining linear and nonlinear processes for multispectral material detection/identification

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3071, Issue , 1997, Pages 106-117

  Peli, Tamar ^a   Young, Mon ^a   Ellis, Ken ^a  

^a Atlantic Aerospace Electronics Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DETECTORS; IDENTIFICATION (CONTROL SYSTEMS); PERFORMANCE; STATISTICAL METHODS;

A PRIORI TARGET STATISTICS; FALSE ALARM REJECTION; SPECTRAL BANDS;

MULTISPECTRAL SCANNERS;

EID: 0031334496     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)