Effect of base electrode on the crystallization and electrical properties of PLT

Integrated Ferroelectrics

Volumn 14, Issue 1-4, 1997, Pages 211-217

  Grill, A ^a   Laibowitz, R ^a   Beach, D ^b   Neumayer, D ^a   Duncombe, P R ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; IRIDIUM COMPOUNDS; LEAD COMPOUNDS; PERMITTIVITY; PLATINUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

LEAD LANTHANUM TITANATE (PLT) FILMS;

DIELECTRIC FILMS;

EID: 0031334278     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708019994     Document Type: Article

References (6)

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3. T. Hase, T. Sakuma, K. Amanuma, T. Mori, A. Ochi and Y. Miyasaka, Integr.Ferroel. 8, 89 (1995).
4. G. Fox, T. M. S. and S. Krupanidhi, Journal of Materials Research 10, 1508 (1995).
5. A. Grill and M. J. Brady, Integr. Ferroel. 9, 299 (1995).
6. D. Beach, R. Laibowitz, T. Shaw, A. Grill and W. Kane, Integrated Ferroelectrics 4, 535 (1994).