High performance 20-30 V LDMOS transistors in a 0.65 μm-based BiCMOS compatible process

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1997, Pages 202-205

  Merchant, Steve ^a   Baird, Robert ^a   Hui, Paul ^a   Thoma, Rainer ^a   Victory, James ^a  

^a Transportation Systems Group   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC RESISTANCE; SEMICONDUCTOR DEVICE STRUCTURES;

METAL DEBIASING;

MOSFET DEVICES;

EID: 0031333961     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)