Stability of amorphous silicon thin film transistors for analog circuit applications

Materials Research Society Symposium - Proceedings

Volumn 467, Issue , 1997, Pages 887-892

  Hornsey, R I ^a   Mahnke, T ^a   Madeira, P ^a   Aflatooni, K ^a   Nathan, A ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; IMAGING TECHNIQUES; LINEAR INTEGRATED CIRCUITS; RELAXATION PROCESSES; SIGNAL PROCESSING; STABILITY; VOLTAGE MEASUREMENT;

AMORPHOUS SILICON THIN FILM TRANSISTORS; ANALOG CIRCUITS; CYCLES OF STRESS; REVERSE BIAS;

THIN FILM TRANSISTORS;

EID: 0031333263     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-467-887     Document Type: Conference Paper

References (11)