Evaluation of surface contamination of titanium dental implants by LV-SEM: Comparison with XPS measurements

Surface and Interface Analysis

Volumn 25, Issue 13, 1997, Pages 983-988

  Morra, Marco ^a   Cassinelli, Clara ^a  

^a Nobil Bio Ricerche Srl   (Italy)

Author keywords

Carbon contamination; Dental implants; LV SEM; Surface contamination; Titanium surfaces

Indexed keywords

CARBON; CONTAMINATION; DENTAL PROSTHESES; SCANNING ELECTRON MICROSCOPY; TITANIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON CONTAMINATION; SURFACE CONTAMINATION;

SURFACE STRUCTURE;

EID: 0031332862     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199712)25:13<983::AID-SIA345>3.0.CO;2-X     Document Type: Review

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