Modelling of PCB variations and its impact on microcontroller immunity

IEE Conference Publication

Volumn , Issue 445, 1997, Pages 100-104

  Sim, John D ^a   Galbraith, Farquhar S ^a   Davenport, Nigel ^a  

^a UNIVERSITY OF THE WEST OF SCOTLAND   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC COMPATIBILITY; OPTIMIZATION; PERMITTIVITY; PRINTED CIRCUIT DESIGN; SEMICONDUCTOR DEVICE MODELS;

MICROCONTROLLER IMMUNITY;

PRINTED CIRCUIT BOARDS;

EID: 0031332756     PISSN: 05379989     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/cp:19971126     Document Type: Conference Paper

References (6)