Measurement of electron/hole mobility in organic/polymeric thin films using modified time-of-flight apparatus

Synthetic Metals

Volumn 91, Issue 1-3, 1997, Pages 169-171

  Chen, Baijun ^a   Liu, Shiyong ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

Mobility; Silicon; Thin films; Time of flight

Indexed keywords

ALUMINUM COMPOUNDS; ELECTRIC FIELD EFFECTS; SILICON; THIN FILMS;

TIME OF FLIGHT (TOF) APPARATUS;

LUMINESCENT DEVICES;

EID: 0031332003     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(97)04005-8     Document Type: Article

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