Direct extraction of the series equivalent circuit parameters for the small-signal model of SOI MOSFET's

IEEE Microwave and Guided Wave Letters

Volumn 7, Issue 12, 1997, Pages 408-410

  Raskin, J P ^a,b   Dambrine, G ^a,c   Gillon, R ^a,b  

^a IEEE   (Belgium)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c INSTITUT D ELECTRONIQUE   (France)

Author keywords

Fet's; MOSFET; Parameter extraction; Scattering parameters measurement; Small signal equivalent circuit

Indexed keywords

ALGORITHMS; ELECTRIC IMPEDANCE; EQUIVALENT CIRCUITS; REGRESSION ANALYSIS; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY;

PARAMETER EXTRACTION; SCATTERING PARAMETERS MEASUREMENT;

MOSFET DEVICES;

EID: 0031331530     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.645191     Document Type: Article

References (6)

1. J. P. Colinge, J. Chen, D. Flandre, J. P. Raskin, R. Gillon, and D. Vanhoenacker, "A low-voltage, low-power microwave SOI MOSFET," in Proc. 1996 IEEE Int. SOI Conf., Fort Myers, FL, Oct. 1996, pp. 128-129.
2. G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, "A new method for determining the FET small-signal equivalent circuit," IEEE Trans. Microwave Theory Tech., vol. 36, no. 7, pp. 1151-1159, July 1988.
3. D. Lovelace, J. Costa, and N. Camilleri, "Extracting small-signal model parameters of silicon MOSFET transistors," in IEEE MTT-S Int. Microwave Symp. Dig., 1994, pp. 865-866.
4. S. Lee, H. K. Yu, C. S. Kim, J. G. Koo, and K. S. Nam, "A novel approach to extracting small-signal model parameters of silicon MOSFET's," IEEE Microwave Guided Wave Lett., vol. 7, no. 3, pp. 75-77, Mar. 1997.
5. G. F. Engen and C. A. Hoer, "Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microwave Theory Tech., vol. MTT-27, no. 4, pp. 987-993, Apr. 1979.
6. R. Gillon, J. P. Raskin, D. Vanhoenacker, and J. P. Colinge, "Determining the reference impedance of on-wafer TLR calibrations on lossy substrates," in 26th EuMC, Prague, Czech Republic, Sept. 9-12, pp. 170-173.