Current sensing circuit for feedback bridging faults

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 110-113

  Hashizume, M ^a   Ichimiya, M ^a   Tamesada, T ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC CURRENTS; ELECTRIC TRANSFORMERS; TESTING;

FEEDBACK BRIDGING FAULTS; IGGQ TEST;

LOGIC CIRCUITS;

EID: 0031331375     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)