Microdefects revealed by x-ray diffuse scattering in czochralski-grown dislocation-free silicon single crystals

Crystallography Reports

Volumn 42, Issue 6, 1997, Pages 1033-1037

  Bublik, V T ^a   Zotov, N M ^a  

^a NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031329108     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)

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