Image sensing with maximum sensitivity using industrial CMOS technology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3099, Issue , 1997, Pages 22-33

  Seitz, Peter ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; IMAGE PROCESSING; INDUSTRIAL APPLICATIONS; OPTICAL FIBERS;

OPTICAL MICROSYSTEMS; SINGLE-PHOTON DETECTION;

OPTICAL SENSORS;

EID: 0031326030     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)