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Volumn 18, Issue 8, 1997, Pages 886-889

Microstructure and Third Order Optical Nonlinearities of Ion-Implanted and Thermally Annealed Cu-SiO2 Thin Films

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[No Author keywords available]

Indexed keywords


EID: 0031324323     PISSN: 02532964     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.