A phase-perturbation technique for light scattering from randomly dielectric rough surfaces

Chinese Physics Letters

Volumn 14, Issue 1, 1997, Pages 32-35

  Zhang, Xiang Dong ^a   Wu, Zhen Sen ^a   Wu, Cheng Ke ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; LIGHT SCATTERING; RADAR CROSS SECTION; SURFACE MEASUREMENT; SURFACE SCATTERING;

BISTATIC; DIELECTRIC ROUGH SURFACE; LASER RADAR CROSS SECTION; NUMERICAL RESULTS; PER UNIT; PHASE PERTURBATION; RADAR CROSS-SECTIONS; ROUGH SURFACE SCATTERING;

PERTURBATION TECHNIQUES;

EID: 0031324302     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/14/1/009     Document Type: Article

References (3)

1. D. Winebrenner and A. Ishimaru, J. Opt. Soc. Am. A 2 (1985) 2285.
2. S. L. Broschat, E. I. Thorsos and A. Ishimaru, J. Electromagnetic Waves and Applications, 3 (1989) 237.
3. X. B. Han, Z. S. Wu and X. D. Zhang, SPIE's Annual Symposium on Optical Science, Engineering and Instrumentation, July 1995 San Diego, USA, p. 2552.