Low energy point reflection electron microscopy

Surface Review and Letters

Volumn 4, Issue 3, 1997, Pages 577-587

  Spence, J C H ^a   Zhang, X ^a   Weierstall, U ^a   Zuo, J M ^a   Munro, E ^b   Rouse, J ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Munro's Electron Beam Software Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031323561     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97000560     Document Type: Article

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