A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle

Analytical Sciences

Volumn 13, Issue 6, 1997, Pages 997-1001

  Zheng, Songyan ^a   Gohshi, Yohichi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Conversion electron yield; Critical angle; Total electron yield; X ray adsorption near edge structure; X ray photoelectron spectroscopy; X ray total reflection

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; NUMERICAL MODELS; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CONVERSION ELECTRONS; CRITICAL ANGLES; TOTAL ELECTRON YIELD; TOTAL REFLECTION; X-RAY ADSORPTION NEAR-EDGE STRUCTURES;

ELECTRONS;

EID: 0031312815     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.13.997     Document Type: Article

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